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Study on Theory and Influence Factors of Self-Healing in Metallized Film Capacitors |
Li Hua1, Zhang Miao1, Lin Fuchang1, Chen Yaohong1, Lü Fei1, Li Zhiwei1, Peng Bo2 |
1. Huazhong University of Science and Technology Wuhan 430074 China 2. Hunan Electric Power Corporation Research Institute Changsha 410007 China |
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Abstract The paper mainly studies the self-healing characteristics and its key influencing factors of metallized film capacitors. The research first indicates that the reduction of self-healing energy is the effective way to improve the lifetime and the reliability of the capacitors. The main influencing factors on self-healing process are studied by physical analysis and electrical parameter measurement. For the metallized film capacitor with sheet resistance above 30Ω/□: ①The breakdown and self-healing event begin when the electric field is 200V/μm. And the probability of breakdown increases to 80% when the electric field is 600V/μm. Thus the reliability of the metallized capacitors would decrease under high electric field. ②The demetallized area and duration time increases with the increasing self-healing energy. Self-healing energy is proportional to the second power of working voltage and is inversely proportional to the second power of sheet resistance. Using metallized film with high sheet resistance, the capacitance loss could decrease and the lifetime of the capacitors could increase. ③The self-healing energy decreases with larger inter-layer pressure with a consequence of smaller demetallized area and shorter duration time. In such condition, the capacitance loss and the reliability of the capacitors could be reduced and enhanced.
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Received: 25 July 2011
Published: 20 March 2014
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[1] 吴广宁, 李晓华, 冉汉政, 等. 高压脉冲造成储能电容器老化的直流局部放电测试技术[J]. 电工技术学报, 2010, 25(7): 172-178. Wu Guangning, Li Xiaohua, Ran Hanzheng, et al. Partial discharge under DC condition with pulse discharge degradation of high voltage storage capacitors[J]. Transactions of China Electro-technical Society, 2010, 25(7): 172-178. [2] Laghari J R, Sarjeant W J. Energy storage pulsed power capacitor technology[J]. IEEE Transactions on Power Electronics, 1992, 1: 251-257. [3] Ennis J B, MacDougall F W, Yang X H, et al. Recent advances in high voltage, high energy capacitor technology[C]. Proceedings of the Pulsed Power Conference, 16th IEEE International, 2007: 282-285. [4] 代新, 林福昌, 李劲, 等. 金属化聚丙烯膜脉冲电容器端部接触老化研究[J]. 中国电机工程学报, 2001, 21(8): 51-54. Dai Xin, Lin Fuchang, Li Jing, et al. Electrode-end contact degradation of metallized polypropylene pulse capacitors[J]. Proceedings of the CSEE, 2001, 21(8): 51-54. [5] 彭宝华, 周经伦, 金光. 综合多种信息的金属化膜电容器可靠性评估[J]. 强激光与粒子束, 2009, 21(8): 1271-1275. Peng Baohua, Zhou Jinglun, Jin Guang. Reliability assessment of metallized film capacitor using multiple reliability information sources[J]. High Power Laser and Part Icle Beams, 2009, 21(8): 1271-1275. [6] Reed C W, Cichanowski S W. The fundamentals of aging in HV polymer-film capacitors[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1994, 1(5): 904-922. [7] Tortai H J, Denat A, Bonifaci N. Self-healing of capacitors with metallized film technology: experimental observations and theoretical model[J]. Journal of Electrostatics, 2001, 53: 159-169. [8] Tortai H J, Bonifaci N, Denat A. Diagnostic of the self-healing of metallized polypropylene film by modeling of the broadening emission lines of aluminum emitted by plasma discharge[J]. Journal of Applied Physics, 2005, 97(5). [9] Walgenwitz B, Tortai J H, Bonifaci N, et al. Self- healing of metallized polymer films of different nature[C]. Proceedings of the 2004 International Conference on Solid Dielectrics, Toulouse, France, 2004: 29-32. [10] 郭大德, 刘宏强. 一种用于强激光系统的高比能脉冲电容器[J]. 强激光与粒子束, 2006, 18(1): 66-68. Guo Dade, Liu Hongqiang. High energy density capacitors in large capacitor banks for high power solid-state laser applications[J]. High Power Laser and Particle Beams, 2006, 18(1): 66-68. [11] Bel’ko V O, Bondarenko P N, Emel’yanvo O A. The dynamic characteristics of self-healing processes in metal film capacitors[J]. Russian Electrical Engineering, 2007, 78(3): 138-142. [12] 孔中华, 林福昌, 戴玲. 金属化电容器中金属丝温升及断开机理[J]. 中国电机工程学报, 2008, 28(36): 119-124. Kong Zhonghua, Lin Fuchang, Dai Ling. Temperature rise and blowing out mechanism of fuse in metallized capacitors[J]. Proceedings of the CSEE, 2008, 28(36): 119-124. [13] Sassoulas P O, Gosse B, Gosse J P. Self-healing breakdown of metallized polypropylene[C]. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics, Eindhoven, Netherlands, 2001: 275-278. [14] Tandon S. Modeling of stresses in cylindrically wound capacitors characterization and the influence of stress on dielectric breakdown of polymeric film[D]. University of Massachusetts Amherst Thesis, 1997. [15] Weibull W. A statistical distribution function of wide applicability[J]. Journal of Applied Mechanics and Technical Physics, 1951, 18: 293-297. [16] Laihonen Sari J. Polypropylene: Morphology, defects and electrical breakdown[M]. Stockholm: Universities Service, US-AB, 2005. [17] Ennis J B, Haskell D K, Sevigny J A. Development of energy storage/pulse capacitors[C]. Proceedings of the IEEE International Power Sources Symposium, 1991: 392-394. [18] Heywang H. Physical and chemical processes in self-curing plastic capacitors[J]. Colloid and Polymer Science, 1976, 254: 138-147. [19] Kammermaier J, Rittmayer G, Birkle S. Modeling of plasma-induced self-healing in organic dielectrics[J]. Journal of Applied Physics, 1989, 66(4): 1594-1609. [20] Peng Bo, Lin Fuchang, Li Hua, et al. Calculation and measurement of metallized film capacitor’s inner pressure and its influence on the self-healing characteristics[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2010, 17(5): 1612-1618. |
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