气体间隙开关触发失效分析及寿命提升方法

doi:10.19595/j.cnki.1000-6753.tces.231908

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Abstract

The trigger failure problem of gas gap switch triggered by plasma jet is serious under the cumulative trigger effect. In order to realize the long life and high stability conduction of gas gap switch, triggering failure analysis and life enhancement experiments have been carried out based on the gas switch trigger life research platform. Firstly, The degradation process of gas gap switch contact performance under cumulative triggering discharge was studied, and the reasons for its triggering failure was analyzed. On this basis, the trigger life enhancement study was carried out for the reasons of trigger failure. The impact characteristics of pulse voltage, energy storage voltage, and triggering cavity gas generation material on the improvement of gas gap switch lifespan were discussed separately.
The results are as follows:
(1) Under the action of high-voltage pulses and arc currents, the primary and secondary trigger cavities are both subjected to varying degrees of degradation. The ablation products that is continuous accumulation in the first stage cavity absorbs high-voltage pulse energy, and reduces the discharge efficiency and energy density. On the other hand, it obstructs the diffusion and propagation of plasma, affecting the jet stability. The combined effect of the two leads to a decrease in the ability of the primary cavity to form a pre-ionization channel. After the cracks occur in the secondary cavity, the integrity and continuity of its surface are damaged, influencing the focusing and transmitting of arc energy. The plasma jet may diffuse along the crack path, causing unstable jetting and sputtering conditions. The continuous expansion in nozzle diameter further delays the internal energy accumulation process of the plasma, resulting in a significant decrease in jet performance. The deterioration of the trigger cavity performance is the main reason for the trigger failure of the gas gap switch.
(2) Increasing the charging voltage of pulse capacitors can effectively reduce discharge delay jitter, but it does not significantly improve the triggering life. By increasing the charging voltage of the energy-storage capacitor, the triggering life and contact stability can be significantly improved. Increasing the injection energy can significantly improve the plasma injection performance and shorten the breakdown time delay. However, the failure of the trigger cavity caused by multiple and large energy injection in the initial triggering stage is also serious, resulting in a shortened lifespan. Therefore, the critical trigger voltage can be applied at the initial stage of triggering to reduce the over-energy ablation, and then the triggering life can be significantly improved by stepped voltage application. As the number of triggering increases, the contact performance of gas switches under different gas producing materials decreases. In addition, after filling with inorganic materials in polytetrafluoroethylene (PTFE), the conductivity and energy deposition rate of the triggering cavity are significantly improved. After doping 0.5% Cu powder with PTFE, the thermal conductivity and conductivity of the discharge channel are improved, and the performance of the jet plasma is significantly improved. But it exacerbates the ablation degradation of the trigger cavity. After doping with 0.2% MoS₂, the anti-arc ablation ability of the trigger cavity is enhanced, but the plasma injecting performance is poor. The triggering lifetime is manifested as PTFE>PTFE+0.2% MoS₂>PTFE+0.5% Cu powder.

Key words： Gas gap switch arc ablation trigger failure lifespan improvement overvoltage and grounding

Received: 15 November 2023

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TM84

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	Dong Bingbing
	Meng Yan
	Guo Zhiyuan

Cite this article:

Dong Bingbing,Meng Yan,Guo Zhiyuan. Trigger Failure Analysis and Life Extension Methods of Gas Gap Switch[J]. Transactions of China Electrotechnical Society, 0, (): 231908-231908.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.231908 OR https://dgjsxb.ces-transaction.com/EN/Y0/V/I/231908

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