Transactions of China Electrotechnical Society  2024, Vol. 39 Issue (5): 1390-1403    DOI: 10.19595/j.cnki.1000-6753.tces.222376
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Study on Loss of Excitation Fault Analysis and Protection of Variable Speed Pumped Storage Units
Lu Qinghui1, Yin Xianggen1, Qiao Jian1, Wang Yikai1, Yin Xin2
1. State Key Laboratory of Advanced Electromagnetic Engineering and Technology Huazhong University of Science and Technology Wuhan 430074 China;
2. School of Electrical and Information Engineering Changsha University of Science & Technology Changsha 410114 China

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