导电微粒局部放电下SF<sub>6</sub>分解组分色谱信号的曲线拟合分峰

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Abstract The overlapped chromatogram signals of the SF₆ decomposed products make it difficult to calculate the products contents, when analyzing its decomposed products by gas chromatograph method. This paper recommends a method to separate the overlapped chromatogram signals with curve-fitting and Gauss function. And it gives the derivation progress of the iterative formula. Meanwhile, it provides a method to confirm the peaks position, peaks intensity and width by iterative formula to separate the overlapped signals. By the simulation of almost completely overlapped signals and partly overlapped signals and the analysis of real chromatogram data under partial discharge (PD) of electrically conductive particles (including the metal protrusions and free metal partials), it proves the validity of this method and can be used on the quantitative analysis study of the relationship between SF₆ decomposed products and GIS failures.

Key words： SF decomposed products overlapped signals gas chromatograph curve-fitting GIS

Received: 19 September 2008 Published: 04 March 2014

PACS:

TM835

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	Zhang Xiaoxing
	Yao Yao
	Tang Ju
	Ren Jiangbo

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Zhang Xiaoxing,Yao Yao,Tang Ju等. Separating Overlapped Chromatogram Signals of SF₆ Decomposed Products Under PD of Conductive Particles Based on Curve-Fitting[J]. Transactions of China Electrotechnical Society, 2010, 25(7): 179-185.

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http://dgjsxb.ces-transaction.com/EN/ OR http://dgjsxb.ces-transaction.com/EN/Y2010/V25/I7/179

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