高频电压下表面电荷分布对沿面放电发展过程的影响

doi:10.19595/j.cnki.1000-6753.tces.170581

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Abstract In order to investigate the influence of surface charge accumulation on surface discharge evolution process under high frequency sinusoidal voltage, surface discharge testing platform and surface charge measurement system was established respectively. Firstly, based on the needle-rod type electrode testing platform, the evolution process of surface discharge patterns and parameters were studied by experiments with testing frequency of 20 kHz and 30 kHz. Furthermore, by measuring the surface charge at different evolution stages, the spatial and temporal distributions of surface charge were summarized. Finally, the surface morphology and chemical structure of polyimide (PI) were tested by means of scanning electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). The experiment results show that the surface discharge has polarity effect, as the discharge amplitude in positive half wave is larger than that in negative half wave. Besides, discharges with high amplitude around the phase of positive peak occurred at middle stage, and the discharge times increased obviously at later stage. The physicochemical defects caused by surface discharge increased during the evolution process, leading to the constant accumulation of negative charges on PI surface. The electric field distortion near needle electrode resulted from surface charge is the main cause of the polarity effect. In contrast with high frequency voltage, negative surface charges accumulated on PI surface is less under power frequency voltage, leading to different polarity effect.

Key words： High frequency voltage polyimide surface discharge surface charge physicochemical defect

Received: 05 May 2017 Published: 12 July 2018

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TM215

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	Lu Yangfei
	Li Qingmin
	Liu Tao
	Huang Xuwei
	Wang Zhongdong

Cite this article:

Lu Yangfei,Li Qingmin,Liu Tao等. Effect of Surface Charge on the Surface Discharge Evolution for Polyimide under High Frequency Voltage[J]. Transactions of China Electrotechnical Society, 2018, 33(13): 3059-3070.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.170581 OR https://dgjsxb.ces-transaction.com/EN/Y2018/V33/I13/3059

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