基于优化模型的直流电缆雷电冲击电压试验波形参数控制

doi:10.19595/j.cnki.1000-6753.tces.160813

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Abstract In a lightning impulse voltage test for DC cable, voltage waveform may contain overshoot and oscillation due to the large capacitance of DC cable and the loop inductance of the test circuit if the resistance parameters of impulse voltage generator are not set properly. To solve this problem, a parameter control method of lightning impulse voltage test waveform based on optimization model was proposed in this paper. At first, based on the theoretical derivation of test circuit and the analysis of the relationship between the wave front time and the overshoot rate, a variable denoted by Δ_m that can be used to characterize the waveform overshoot rate was introduced. Secondly, the resistance parameters optimization model with the objective function of minimizing the front time was established, in which the overshoot rate constraint can be achieved by limiting the value of Δ_m. Finally, the model was solved by using various values of Δ_m, and then the simulation and experimental studies were carried out to verify its validity. The results show that overshoot rate increases and front time decreases with the increase of Δ_m, so the optimization model can effectively control the parameters of the impulse waveform. In order to determine the reasonable range of Δ_m, the effect of Δ_m on overshoot rate and front time with different values of cable capacitance and loop inductance was studied. The result indicates that the reasonable range of Δ_m should be 0.9~1 which can ensure that the overshoot rate does not exceed the standard limit of 10%.

Key words： DC cable lightning impulse test loop inductance overshoot rate front time optimization model

Received: 02 June 2016 Published: 14 September 2017

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TM835

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	Le Yanjie
	Yu Enke
	Chen Guozhi
	Zhang Lei
	Zhang Jian
	Gao Zhen

Cite this article:

Le Yanjie,Yu Enke,Chen Guozhi等. Parameter Control of Lightning Impulse Voltage Test Waveform for DC Power Cable Based on Optimization Model[J]. Transactions of China Electrotechnical Society, 2017, 32(17): 225-234.

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https://dgjsxb.ces-transaction.com/EN/10.19595/j.cnki.1000-6753.tces.160813 OR https://dgjsxb.ces-transaction.com/EN/Y2017/V32/I17/225

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