柱上开关开断对二次智能设备的电磁干扰研究

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Abstract The higher requirement of intelligent equipment is put forward with the construction and development of smart grid. The safe and reliable operation of secondary control and protection devices is the important guarantee to realize the intelligentialize of the primary equipment. Pole- mounted switch is the key equipment for the protection and control in the power distribution system, and the high frequency signal produced during the breaking arc process is known to be one of serious sources of electromagnetic interference(EMI) to its secondary smart equipment, which can lead to secondary devices of pole-mounted switch display malfunction. Hence, it is of great significance to study the EMI problem of the secondary smart equipment due to the operations of pole-mounted switch. This paper carried out the synthetic test for 10kV pole-mounted switch by using synthetic test circuit. The output signal of current transformer(CT), the input and output signals of FTU controller were collected at the same time, and then obtained the disturbance frequency band and energy distribution of the signals due to the breaking of pole-mounted switch by time-frequency characteristic analysis. Results show that, the secondary sides of CT and FTU controller are bearing the transient EMI when pole-mounted switch is in operation; the frequency distribute is mainly in 7.81~15.62MHz due to the breaking arcing process of pole-mounted switch; the frequency distribute is mainly in 31.25~62.5MHz at the time of arc current passing zero; the EMI caused by transient recovery voltage(TRV) is mainly distribution in 31.25~125MHz.

Key words： Pole-mounted switch FTU controller EMI synthetic test wavelet analysis frequency distribution

Received: 14 April 2014 Published: 25 May 2015

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TM561

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	Li Peng
	Huang Daochun
	Ruan Jiangjun
	Zhu Chenguang
	Niu Xiaobo
	Pu Ziheng

Cite this article:

Li Peng,Huang Daochun,Ruan Jiangjun等. The EMI Study of Pole-Mounted Switch’s Breaking on Its Secondary Smart Devices[J]. Transactions of China Electrotechnical Society, 2015, 30(8): 27-37.

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http://dgjsxb.ces-transaction.com/EN/ OR http://dgjsxb.ces-transaction.com/EN/Y2015/V30/I8/27

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