电工技术学报  2018, Vol. 33 Issue (18): 4277-4285    DOI: 10.19595/j.cnki.1000-6753.tces.170875
电力电子 |
压接型IGBT器件单芯片子模组疲劳失效的仿真
张经纬1, 邓二平1, 2, 赵志斌1, 李金元2, 黄永章1
1. 新能源电力系统国家重点实验室(华北电力大学) 北京 102206;
2. 国家电网全球能源互联网研究院 北京 102209
Simulation on Fatigue Failure of Single IGBT Chip Module of Press-Pack IGBTs
Zhang Jingwei1, Deng Erping1, 2, Zhao Zhibin1, Li Jinyuan2, Huang Yongzhang1
1. State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources North China Electrical Power University Beijing 102206 China;
2. State Grid Global Energy Interconnection Research Institute Beijing 102209 China