永磁扰动检测有限元分析及优化设计

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摘要永磁扰动检测是一种新型无损检测技术,通过永磁扰动传感器在铁磁构件表面扫查并拾取受缺陷影响下静磁场变化情况来判别缺陷尺寸大小。本文深入分析了永磁体与缺陷的扰动机制,并针对传感器设计理论不足、永磁扰动检测信号微弱等问题,提出了采用环绕式体线圈探测永磁体内产生的磁扰动及采用螺旋线圈探测永磁体与缺陷间的外磁扰动,并在此基础上探究感应线圈及永磁体的几何参数对永磁扰动检测效率的影响。通过有限元模型多参数化扫描及正交试验设计方法对永磁扰动传感器进行了优化设计,该方法能够有效地提高永磁扰动内、外感应电压的幅值。

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	蔡智超
	刘素贞
	张闯
	金亮
	杨庆新

关键词 ：内永磁扰动, 外永磁扰动, 有限元分析, 优化设计, 正交试验设计

Abstract：Permanent magnetic field perturbation testing(PMFP) is a new method for nonde- structive testing. The method can be applied in detecting surface crack and judging crack size by the static magnetic field variation when the magnet moves along the surface of metal. While the deficiency of designing theories and the weak signal of PMFP severely confine the further expansion of their scope of application. In order to thoroughly solve these problems, the perturbation mechanism should be further analyzed. From magnetic disturbance mechanism, a PMFP sensor structure is proposed that the body coil could detect the inner PMFP and the spiral coil could detect the outer PMFP which between permanent magnet and the defect. With the basic designing principle of the PMFP sensor, the key parameters of PMFP sensor structure are discussed, which significantly influence the detection efficiency. And the transduction efficiency of PMFP could be effectively improved by utilizing orthogonal test method based upon the finite element model of parameterized scanning.

Key words： Inner PMFP outer PMFP finite element analysis optimum design orthogonal test design

收稿日期: 2014-08-30 出版日期: 2015-04-13

PACS:

TM153

基金资助:国家自然科学基金（51207105、51307043）和河北省自然科学基金（E2012202026、E2012202048）资助项目

作者简介: 蔡智超男,1989年生,博士研究生,主要从事电磁无损检测技术方面的研究工作。刘素贞（通信作者）女,1969年生,博士,教授,博士生导师,主要从事工程电磁场与磁技术方面的研究工作。

引用本文:

蔡智超,刘素贞,张闯,金亮,杨庆新. 永磁扰动检测有限元分析及优化设计[J]. 电工技术学报, 2015, 30(3): 67-72. Cai Zhichao,Liu Suzhen,Zhang Chuang,Jin Liang,Yang Qingxin. Finite Element Analysis and Optimum Design of Permanent Magnetic Field Perturbation Testing. Transactions of China Electrotechnical Society, 2015, 30(3): 67-72.

链接本文:

http://dgjsxb.ces-transaction.com/CN/Y2015/V30/I3/67

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