直流GIL中固-气界面电荷特性研究综述Ⅰ：测量技术及积聚机理

doi:10.19595/j.cnki.1000-6753.tces.180915

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摘要

气体绝缘输电线路（GIL）是一种先进的输电方式,可满足特殊环境下的输电需求。然而,在直流电压下,GIL绝缘子表面存在显著的电荷积聚现象,极易引发沿面闪络,严重制约了GIL在直流工程中的应用。因此,开展直流GIL中固-气界面电荷特性的研究具有重要意义。在此背景下,本系列文章综述了多年来国内外有关直流GIL中固-气界面电荷特性的主要研究成果。本文综述Ⅰ首先总结了目前测量表面电荷的三种主要方法,介绍了基于数字图像处理技术的电荷反演算法;其次,从早期研究基础和目前研究现状两方面重点分析固-气界面电荷的积聚机理和仿真模型,并提出电荷积聚可能存在的两种模式：“基本”模式和“电荷斑”模式;最后,从固-气界面电荷的测量技术、仿真模型和机理研究三方面对未来工作给出了相关建议。

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	张博雅
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关键词 ：直流, 气体绝缘输电线路, 表面电荷, 电荷积聚, 综述

Abstract：

As an advanced power transmission method, gas insulated transmission line (GIL) can transmit power under special conditions. However, charge accumulation on the insulator surface in GIL is very severe under DC field, leading to flashover easily, which restricts the application of GIL in DC projects. Therefore, it is of great significance to study charge accumulation characteristics at gas-solid interface in DC GIL. In this series, research results in this area were reviewed. In Part I, firstly, three surface charge measurement methods were summarized, and the inversion algorithm based on the image processing technique was introduced. Besides, mechanisms and simulation models of charge accumulation were analyzed based on early studies and recent research status. Two patterns of charge accumulation were proposed, namely dominant charging and charge speckles. Finally, proposals from three aspects, i.e. measurement, modeling, and mechanism, were presented for future work.

Key words： DC gas insulated transmission line (GIL) surface charge charge accumulation review

收稿日期: 2018-05-29 出版日期: 2018-10-30

PACS:

TM85

基金资助:

国家重点基础研究发展计划（973计划）（2014CB239502）

作者简介: 张博雅男,1990年生,博士,讲师,研究方向为气体绝缘电气设备、气体放电及等离子体以及电介质材料。E-mail: zhangby13@xjtu.edu.cn （通信作者）; 张贵新男,1963年生,博士,教授,博士生导师,研究方向为等离子体技术、光电测量、气体绝缘电气设备及电介质材料。E-mail: guixin@tsinghua.edu.cn

引用本文:

张博雅, 张贵新. 直流GIL中固-气界面电荷特性研究综述Ⅰ：测量技术及积聚机理[J]. 电工技术学报, 2018, 33(20): 4649-4662. Zhang Boya, Zhang Guixin. Review of Charge Accumulation Characteristics at Gas-Solid Interface in DC GIL, Part I: Measurement and Mechanisms. Transactions of China Electrotechnical Society, 2018, 33(20): 4649-4662.

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